Thinfilm logo


By Fredrik Hansteen 1999


Welcome to Thinfilm v.1.2

Thinfilm is a program for calculating the reflectivity and transmitivity of any thin-film multilayer structure. It can be used to design anti-reflection coatings, simulate surface plasmon devices, calculate the reflectivity of bulk materials, etc.

Since version 1.2 the ellipsometric quantities Psi and Delta can also be calculated.

The system consists of a front-end web-interface (Perl), a back-end numerical solver (C++) and a database of optical constants of selected materials (more kan be added on request).

Calculations can be made as a function of the angle of incidence or wavelength.

Graphical output is provided as PNG images or PostScript. Raw data suitable for plotting using your favourite plotting program is also provided.

Send comments / bug reports to fredrik@hansteen.net

Also try my Superlattice program